TY - JOUR T1 - Superior efficiency and long-lifetime in non-exciplex organic light-emitting diodes enabled by accelerated Dexter energy transfer AU - Song, You Na AU - Park, Sangwook AU - Lee, Jaehyun AU - Park, Jongwook AU - Kim, Taekyung JO - Chemical Engineering Journal VL - 511 SP - 162011 PY - 2025 DA - 2025/05/01/ SN - 1385-8947 DO - https://doi.org/10.1016/j.cej.2025.162011 UR - https://www.sciencedirect.com/science/article/pii/S1385894725028372 KW - Organic light-emitting diodes KW - Lifetime KW - Phosphorescence KW - Non-exciplex KW - Dexterenergy transfer AB - Triplets harvested from the exciplex state are transferred to the dopant via Förster resonance energy transfer (FRET), leading to high exciton utilization efficiency. However, “dark triplets” that fail to undergo up-conversion to singlets act as degradation factors due to slow electron exchange mechanism of Dexter energy transfer (DET). Thus, it is widely accepted that boosting FRET and suppressing DET is critical in organic light-emitting diode (OLED) performance. Here, we aim to challenge such a generally acknowledged concept by activating and accelerating DET processes. Non-exciplex-based OLEDs were fabricated using an n-type host, 4-(2,12-di-tert-butyl-5,9-dioxa-13b-boranaphtho[3,2,1-de]anthracen-7-yl)phenyl)triphenylsilane. Due to the absence of exciplex formation, the DET channel of the n-type host was fully activated. The DET rate of 9.57 × 106/s in the non-exciplex system, comparable to the FRET rate in the exciplex system, enhances exciton utilization by converting dark triplets into “bright triplets,” reducing the dark triplet population. As a result, the enhanced efficiency and lifetimes were achieved simultaneously. Our non-exciplex phosphor-sensitized-fluorescent (PSF)-OLED achieved an external quantum efficiency of 26.1 % and an LT80 of 216 h, six times longer than that of exciplex-based PSF-OLEDs. This study presents a novel pathway for high-efficiency, long-lifetime blue phosphorescent OLEDs through accelerated DET, previously known for negatively impacting device performance. ER -